Announcing Vista 200
Check out our new semiconductor-specific instrument
Inorganic Applications
AFM-IR-Raman: Using Three Techniques for Better Nano-Chemical Analysis
Background Raman microscopy is becoming increasingly popular, and companies are creating new products that combine…
Analyzing Forensic Trace Evidence with IR PiFM
Background Trace Evidence Analysis is the discipline of forensic science that deals with the minute…
Analyzing Mixed Nanoplastics for Environmental Studies
Microplastics, defined as plastic fragments less than 5 mm in length, are classified as primary or secondary...
AFM-IR Chemical Analysis of Nanoscale Defects and Residues
Of critical importance in many manufacturing processes is the management of defects.
Vista-IR-S
While PiFM enjoys excellent traits such as ~5 nm spatial resolution and monolayer sensitivity on…
Visible PiFM
While PiFM provides excellent nanoscale chemical mapping and spectral analysis capabilities when coupled with broadly…
Study of Organic-Inorganic Compound vs PiFM
Block-selective infiltration with inorganics such as metal oxides on self-assembled block copolymer patterns should provide…
Cross-sectional IR PiFM Analysis
Multi-layers of different materials find usage across various applications. The thicknesses of the layers range…
Chemical Mapping
Advances in nanotechnology have intensified the need for analytical tools that can chemically characterize newly…
Surface Plasmon Polaritons Visualized with PiFM
Surface plasmon polaritons (SPP) at the gold-air surface imaged via PiFM. p-polarized 809 nm laser…
Nanoscale Defect Analysis
As device sizes shrink, it becomes increasingly important to identify nanoscale defects as they directly…
Visualization of Hermite Gaussian Focal Spot
The longitudinal focal field of a tightly focused light via high NA (1.45 NA) objective…